
Semiconductor devices. Micro-electromechanical devices. Silicon based MEMS fabrication technology. Measurement method of tensile strength of nanoscale thickness membrane.
NORMA vydána dne 30.4.2025
Designation standards: BS IEC 62047-46:2025
Publication date standards: 30.4.2025
The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
Country: British technical standard
Kategorie: Technické normy BS
ISBN: 978 0 539 21850 3 Status: Definitive