
Semiconductor devices. Micro-electromechanical devices. Environmental and dielectric withstand test methods for MEMS piezoelectric thin films.
NORMA vydána dne 24.4.2019
Designation standards: BS IEC 62047-36:2019
Publication date standards: 24.4.2019
The number of pages: 20
Approximate weight : 60 g (0.13 lbs)
Country: British technical standard
Kategorie: Technické normy BS
ISBN: 978 0 580 99118 9 Status: Definitive