BS IEC 62047-35:2019

Semiconductor devices. Micro-electromechanical devices. Test method of electrical characteristics under bending deformation for flexible electromechanical devices.

NORMA vydána dne 20.4.2021

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The information about the standard:

Designation standards: BS IEC 62047-35:2019
Publication date standards: 20.4.2021
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: British technical standard
Kategorie: Technické normy BS

Annotation of standard text BS IEC 62047-35:2019 :

ISBN: 978 0 580 99495 1 Status: Definitive