
Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level.
NORMA vydána dne 6.9.2022
Designation standards: BS EN IEC 60749-28:2022
Publication date standards: 6.9.2022
The number of pages: 54
Approximate weight : 162 g (0.36 lbs)
Country: British technical standard
Kategorie: Technické normy BS
ISBN: 978 0 539 13657 9 Status: Definitive