
Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs).
NORMA vydána dne 30.6.2010
Designation standards: BS EN 62417:2010
Publication date standards: 30.6.2010
The number of pages: 12
Approximate weight : 36 g (0.08 lbs)
Country: British technical standard
Kategorie: Technické normy BS
ISBN: 978 0 580 58622 4 Status: Definitive