BS EN 62373:2006

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET).

NORMA vydána dne 29.9.2006

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The information about the standard:

Designation standards: BS EN 62373:2006
Publication date standards: 29.9.2006
The number of pages: 16
Approximate weight : 48 g (0.11 lbs)
Country: British technical standard
Kategorie: Technické normy BS

Annotation of standard text BS EN 62373:2006 :

ISBN: 0 580 49255 9 Status: Definitive