BS EN 60749-38:2008

Semiconductor devices. Mechanical and climatic test methods. Soft error test method for semiconductor devices with memory.

NORMA vydána dne 30.6.2008

Anglicky -
PDF - okamžité stažení (4660.10 CZK)

Anglicky -

Tištěné (4660.10 CZK)

The information about the standard:

Designation standards: BS EN 60749-38:2008
Publication date standards: 30.6.2008
The number of pages: 16
Approximate weight : 48 g (0.11 lbs)
Country: British technical standard
Kategorie: Technické normy BS

Annotation of standard text BS EN 60749-38:2008 :

ISBN: 978 0 580 54875 8 Status: Definitive