ASTM F1892-12(2018)

Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

NORMA vydána dne 1.3.2018

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The information about the standard:

Designation standards: ASTM F1892-12(2018)
Publication date standards: 1.3.2018
The number of pages: 41
Approximate weight : 123 g (0.27 lbs)
Country: American technical standard
Kategorie: Technické normy ASTM

Annotation of standard text ASTM F1892-12(2018) :

Keywords:
ASIC (application specific integrated circuit), bipolar, cobalt 60 testing, ELDRS (enhanced low dose rate sensitivity), gamma ray tests, ionizing radiation testing, MOS, radiation hardness, semiconductor devices, time dependent effects, total dose testing, X-ray testing,, ICS Number Code 31.080.01 (Semi-conductor devices in general)