Test Method for Crystallographic Perfection of Gallium Arsenide by Molten Potassium Hydroxide (KOH) Etch Technique (Withdrawn 2016)

Informace o normě:

Označení normy: ASTM F1404-92(2007)
Poznámka: NEPLATNÁ
Datum vydání normy: 1.12.2007
Počet stran: 6
Přibližná hmotnost: 18 g (0.04 liber)
Země: Americká technická norma
Kategorie: Technické normy ASTM

Anotace textu normy ASTM F1404-92(2007) :

Keywords:
crystal perfection, etch pit density, gallium arsenide, potassium hydroxide etch, semiconductor, single crystal, Contamination semiconductors, Crystal lattice structure, Defects semiconductors, Density electronic applications, Etching (materials/process), Etch pit density (EPD), Gallium arsenide, Impurities electronic materials/applications, KOH etch pits, Microscopic examination electronic materials, Molten KOH etch technique, Monocrystalline perfection