Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)

Informace o normě:

Označení normy: ASTM F1262M-95(2008)
Poznámka: NEPLATNÁ
Datum vydání normy: 15.6.2008
Počet stran: 5
Přibližná hmotnost: 15 g (0.03 liber)
Země: Americká technická norma
Kategorie: Technické normy ASTM

Anotace textu normy ASTM F1262M-95(2008) :

Keywords:
digital integrated circuits, digital IC´s, functional errors, ionizing, pulsed radiation, radiation, transient radiation, upset threshold, Combinational logic, Destructive testing--semiconductors, Digital integrated circuits, Electrical conductors (semiconductors), Failure end point--electronic components/devices, 0Functional errors, Integrated circuits, Ionizing radiation, Irradiance/irradiation--semiconductors, 0Microelectronic devices, MSI integrated circuits, Output transient voltage