Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
NORMA vydána dne 1.6.2016
Designation standards: ASTM E431-96(2016)
Note: NEPLATNÁ
Publication date standards: 1.6.2016
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: American technical standard
Kategorie: Technické normy ASTM
Keywords:
electronic devices, nondestructive testing, radiographs, radiography, reference illustrations, semiconductors, x-ray,, ICS Number Code 31.080.01 (Semi-conductor devices in general)