Guide for The Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

The information about the standard:

Designation standards: ASTM F980-92
Note: NEPLATNÁ
Publication date standards: 1.1.1992
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: American technical standard
Kategorie: Technické normy ASTM

Annotation of standard text ASTM F980-92 :

Keywords:
Annealing, Defects-semiconductors, Destructive testing-semiconductors, Displacement damage, Electrical conductors-semiconductors, Electronic hardness, Hardness tests-radiation (of semiconductors), Integrated circuits, Neutron radiation, Pulsed neutron-radiation source, Radiation exposure-electronic components/devices, Radiation-hardness testing, Short term damage, Vulnerability, rapid annealing of neutron-induced displacement damage in semiconductor, devices, guide,, Rapid annealing effects