Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

Informace o normě:

Označení normy: ASTM F980-10
Poznámka: NEPLATNÁ
Datum vydání normy: 10.6.1996
Počet stran: 5
Přibližná hmotnost: 15 g (0.03 liber)
Země: Americká technická norma
Kategorie: Technické normy ASTM

Anotace textu normy ASTM F980-10 :

Keywords:
annealing factor, annealing function, displacement damage, integrated circuits, neutron damage, neutron degradation, photoconducting device, rapid annealing, semiconductor devices, Annealing, Defects--semiconductors, Destructive testing--semiconductors, Displacement--electronic materials/applications, Electrical conductors (semiconductors), Electronic hardness, Integrated circuits, Neutron radiation, Pulsed neutron-radiation source, Radiation exposure--electronic components/devices