ASTM F80-94

Test Method for Crystallographic Perfection of Epitaxial Deposits of Silicon by Etching Techniques (Withdrawn 1998)

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The information about the standard:

Designation standards: ASTM F80-94
Note: NEPLATNÁ
The number of pages: 9
Approximate weight : 27 g (0.06 lbs)
Country: American technical standard
Kategorie: Technické normy ASTM

Annotation of standard text ASTM F80-94 :

Keywords:
ICS Number Code 29.045 (Semiconducting materials)