Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors

Informace o normě:

Označení normy: ASTM F76-08
Poznámka: NEPLATNÁ
Datum vydání normy: 15.6.2008
Počet stran: 14
Přibližná hmotnost: 42 g (0.09 liber)
Země: Americká technická norma
Kategorie: Technické normy ASTM

Anotace textu normy ASTM F76-08 :

Keywords:
gallium arsenide, Hall coefficient, Hall data, Hall mobility, Hall resistivity, semiconductor, silicon, single crystal, van der Pauw, Bridge-type electrical/electronic materials, Crystal lattice structure, Eight-contact semiconductor specimens, Electrical conductors (semiconductors), Electrical resistance/resistivity--semiconductors, Etching (materials/process), Gallium arsenide phosphide, Germanium--semiconductor applications, Hall effect measurement, Lamellar semiconductor materials