Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits

Informace o normě:

Označení normy: ASTM F744M-97
Poznámka: NEPLATNÁ
Datum vydání normy: 1.1.1997
Počet stran: 6
Přibližná hmotnost: 18 g (0.04 liber)
Země: Americká technická norma
Kategorie: Technické normy ASTM

Anotace textu normy ASTM F744M-97 :

Keywords:
Circuitry, Current measurement-semiconductors, Destructive testing-semiconductors, Dose rate threshold, Dosimetry, Electrical conductors-semiconductors, Electron linear accelerator, Flash x-ray machines (FXR), Integrated circuits, Irradiance/irradiation-semiconductors, Lasers and laser applications, Linear threshold voltage, Radiation exposure-electronic components/devices, Upset threshold, Voltage, radiation dose rate threshold for determining upset threshold of digital