Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]

Informace o normě:

Označení normy: ASTM F744M-10
Poznámka: NEPLATNÁ
Datum vydání normy: 1.5.2010
Počet stran: 7
Přibližná hmotnost: 21 g (0.05 liber)
Země: Americká technická norma
Kategorie: Technické normy ASTM

Anotace textu normy ASTM F744M-10 :

Keywords:
DIC, digital integrated circuits, dose rate, ionizing radiation, radiation dose rate, threshold for upset, upset, Circuitry, Current measurement--semiconductors, Destructive testing--semiconductors, Dose rate threshold, Dosimetry, Electrical conductors (semiconductors), Electron linear accelerator, Flash X-ray machines (FXR), Irradiance/irradiation--semiconductors, Lasers and laser applications, Linear threshold voltage, Radiation exposure--electronic components/devices, Upset threshold, Voltage