Standard Test Methods for Measuring Resistivity of Semiconductor Slices or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gage (Includes all amendments And changes 8/16/2017).

The information about the standard:

Designation standards: ASTM F673-90(1996)e1
Note: NEPLATNÁ
Publication date standards: 1.1.1996
The number of pages: 11
Approximate weight : 33 g (0.07 lbs)
Country: American technical standard
Kategorie: Technické normy ASTM

Annotation of standard text ASTM F673-90(1996)e1 :

Keywords:
Contactless measurements, Eddy current examination, Electrical conductors-semiconductors, Electromagnetic (eddy current) testing, Nondestructive evaluation (NDE)-semiconductors, Resistivity (electrical)-semiconductors, Sheet resistance, Silicon semiconductors-slices/wafers, resistivity of semiconductor slices/sheet resistance of semiconductor, films, with non-contact eddy-current gage, test,,Order Form, ICS Number Code 29.045 (Semiconducting materials)