Standard Test Methods for Measuring Resistivity of Semiconductor Slices or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gage (Includes all amendments And changes 8/16/2017).
NORMA vydána dne 1.1.1996
Označení normy: ASTM F673-90(1996)e1
Poznámka: NEPLATNÁ
Datum vydání normy: 1.1.1996
Počet stran: 11
Přibližná hmotnost: 33 g (0.07 liber)
Země: Americká technická norma
Kategorie: Technické normy ASTM
Keywords:
Contactless measurements, Eddy current examination, Electrical conductors-semiconductors, Electromagnetic (eddy current) testing, Nondestructive evaluation (NDE)-semiconductors, Resistivity (electrical)-semiconductors, Sheet resistance, Silicon semiconductors-slices/wafers, resistivity of semiconductor slices/sheet resistance of semiconductor, films, with non-contact eddy-current gage, test,,Order Form, ICS Number Code 29.045 (Semiconducting materials)