ASTM F671-99

Standard Test Method for Measuring Flat Length on Wafers of Silicon and Other Electronic Materials (Withdrawn 2003)

NORMA vydána dne 10.12.1999

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The information about the standard:

Designation standards: ASTM F671-99
Note: NEPLATNÁ
Publication date standards: 10.12.1999
The number of pages: 4
Approximate weight : 12 g (0.03 lbs)
Country: American technical standard
Kategorie: Technické normy ASTM

Annotation of standard text ASTM F671-99 :

Keywords:
flats, optical comparator, orientation flats, semiconductor, silicon, ICS Number Code 29.045 (Semiconducting materials)