Standard Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum

Informace o normě:

Označení normy: ASTM F398-92(1997)
Poznámka: NEPLATNÁ
Datum vydání normy: 10.6.1997
Počet stran: 10
Přibližná hmotnost: 30 g (0.07 liber)
Země: Americká technická norma
Kategorie: Technické normy ASTM

Anotace textu normy ASTM F398-92(1997) :

Keywords:
Carrier concentration, Electrical conductors-semiconductors, Gallium arsenide, Germanium-semiconductor applications, Impurities-semiconductors, Infrared (IR) analysis-semiconductors, Minority carriers, Plasma resonance (wavelength), Reflectance and reflectivity-electronic materials/applications, Resonance wavelength, Silicon-semiconductor applications, Spectrophotometry-infrared (of semiconductors), Wavelength, majority carrier concentration in doped semiconductors, by measuring