Standard Test Methods for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage

Informace o normě:

Označení normy: ASTM F391-96
Poznámka: NEPLATNÁ
Datum vydání normy: 1.1.1996
Počet stran: 9
Přibližná hmotnost: 27 g (0.06 liber)
Země: Americká technická norma
Kategorie: Technické normy ASTM

Anotace textu normy ASTM F391-96 :

Keywords:
CMSPV (constant magnitude surface photovoltage) method, Diffusion length, Electrical conductors,emsemiconductors, LPVCPF (linear photovoltage/constant photon flux) method, Minority carriers, Silicon semiconductors, Single crystal silicon semiconductors, Surface analysis,emelectronic components/devices, Surface photovoltage (SPV), minority carrier diffusion length,emextrinsic single-crystal, semiconductors/homoepitaxial layers, by steady-state surface, photovoltage (SPV), test,,Order Form