Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Resolution Glow Discharge Mass Spectrometer

Informace o normě:

Označení normy: ASTM F1845-08
Poznámka: NEPLATNÁ
Datum vydání normy: 15.6.2008
Počet stran: 4
Přibližná hmotnost: 12 g (0.03 liber)
Země: Americká technická norma
Kategorie: Technické normy ASTM

Anotace textu normy ASTM F1845-08 :

Keywords:
aluminum, aluminum-copper alloys, aluminum-copper-silicon alloys, aluminum-silicon alloys, electronics, glow discharge mass spectrometer (GDMS), purity analysis, sputtering target, trace metallic impurities, Impurities--electronic materials/applications, Mass spectrometry--electronic materials/applications, Trace metallic impurities, Aluminum alloys (electronic), Aluminum electrical conductors (semiconductors), Electronic-grade metals, Glow discharge mass spectrometer (GDMS)