NORMSERVIS s.r.o.

ASTM F1809-02

Standard Guide for Selection and Use of Etching Solutions to Delineate Structural Defects in Silicon (Withdrawn 2003)

NORMA vydána dne 10.12.2002

Anglicky -
Online zabezpečené PDF (1749.70 CZK)
Anglicky -
Tištěné (1749.70 CZK)

The information about the standard:

Designation standards: ASTM F1809-02
Note: NEPLATNÁ
Publication date standards: 10.12.2002
The number of pages: 9
Approximate weight : 27 g (0.06 lbs)
Country: American technical standard
Kategorie: Technické normy ASTM

Annotation of standard text ASTM F1809-02 :

Keywords:
defect density, dislocation, grain boundary, microscopic, polycrystalline, imperfection, preferential etch, silicon, slip, ICS Number Code 29.045 (Semiconducting materials)