ASTM F1771-97

Standard Test Method for Evaluating Gate Oxide Integrity by Voltage Ramp Technique

NORMA vydána dne 10.2.1997

Anglicky -
PDF - okamžité stažení (1717.40 CZK)

The information about the standard:

Designation standards: ASTM F1771-97
Note: NEPLATNÁ
Publication date standards: 10.2.1997
The number of pages: 8
Approximate weight : 24 g (0.05 lbs)
Country: American technical standard
Kategorie: Technické normy ASTM

Annotation of standard text ASTM F1771-97 :

Keywords:
current density, defect density, electric field strength, extrinsic breakdown, intrinsic breakdown, oxide breakdown