ASTM F1630-00

Standard Test Method for Low Temperature FT-IR Analysis of Single Crystal Silicon for III-V Impurities (Withdrawn 2003)

NORMA vydána dne 10.12.2000

Anglicky -
PDF - okamžité stažení (1753.30 CZK)

The information about the standard:

Designation standards: ASTM F1630-00
Note: NEPLATNÁ
Publication date standards: 10.12.2000
The number of pages: 6
Approximate weight : 18 g (0.04 lbs)
Country: American technical standard
Kategorie: Technické normy ASTM

Annotation of standard text ASTM F1630-00 :

Keywords:
analysis of silicon, determination of dopants, determination of impurities, electrically active impurities, Fourier transform infrared, impurities, silicon, ICS Number Code 29.045 (Semiconducting materials)