Standard Test Method for Carrier Recombination Lifetime in Silicon Wafers by Noncontact Measurement of Photoconductivity Decay by Microwave Reflectance (Withdrawn 2003)
NORMA vydána dne 10.6.2000
Označení normy: ASTM F1535-00
Poznámka: NEPLATNÁ
Datum vydání normy: 10.6.2000
Počet stran: 12
Přibližná hmotnost: 36 g (0.08 liber)
Země: Americká technická norma
Kategorie: Technické normy ASTM
Keywords:
Carrier recombination lifetime, Contactless measurement, Free carrier density, Impurities-semiconductors, Microwave reflection, Photoconductivity decay, Recombination lifetime, Silicon semiconductors-slices/wafers, carrier recombination lifetime-silicon wafers, by noncontact measurement, of photoconductivity decay by microwave reflectance, test, ICS Number Code 29.045 (Semiconducting materials)