Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

Informace o normě:

Označení normy: ASTM F1467-99(2005)
Poznámka: NEPLATNÁ
Datum vydání normy: 1.1.2005
Počet stran: 18
Přibližná hmotnost: 54 g (0.12 liber)
Země: Americká technická norma
Kategorie: Technické normy ASTM

Anotace textu normy ASTM F1467-99(2005) :

Keywords:
Collimator, Electrical conductors-semiconductors, Electronic hardness, Experimental design, Hardness tests-radiation (of semiconductors), Ionizing radiation, Low energy ([aprox] 10 keV photons) X-ray sources, Microcircuits, Microelectronic device processing, Radiation effects testing, Radiation exposure-electronic components/devices, Radiation-hardness testing, Semiconductor device testing, X-ray testing, X-ray tester ([aprox] 10 keV photons)-ionizing radiation effects testing