NORMSERVIS s.r.o.

ASTM F1451-92(1999)

Standard Test Method for Measuring Sori on Silicon Wafers by Automated Noncontact Scanning (Withdrawn 2003)

NORMA vydána dne 1.1.1999

Anglicky -
Online zabezpečené PDF (1993.90 CZK)
Anglicky -
Tištěné (1993.90 CZK)

The information about the standard:

Designation standards: ASTM F1451-92(1999)
Note: NEPLATNÁ
Publication date standards: 1.1.1999
The number of pages: 12
Approximate weight : 36 g (0.08 lbs)
Country: American technical standard
Kategorie: Technické normy ASTM

Annotation of standard text ASTM F1451-92(1999) :

Keywords:
noncontact measurement, semiconductor, shape, silicon, sori, wafers, ICS Number Code 29.045 (Semiconducting materials)