Test Method for Crystallographic Perfection of Gallium Arsenide by Molten Potassium Hydroxide (KOH) Etch Technique (Withdrawn 2016)
NORMA vydána dne 1.12.2007
Designation standards: ASTM F1404-92(2007)
Note: NEPLATNÁ
Publication date standards: 1.12.2007
The number of pages: 6
Approximate weight : 18 g (0.04 lbs)
Country: American technical standard
Kategorie: Technické normy ASTM
Keywords:
crystal perfection, etch pit density, gallium arsenide, potassium hydroxide etch, semiconductor, single crystal, Contamination semiconductors, Crystal lattice structure, Defects semiconductors, Density electronic applications, Etching (materials/process), Etch pit density (EPD), Gallium arsenide, Impurities electronic materials/applications, KOH etch pits, Microscopic examination electronic materials, Molten KOH etch technique, Monocrystalline perfection