Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)

The information about the standard:

Designation standards: ASTM F1262M-95(2008)
Note: NEPLATNÁ
Publication date standards: 15.6.2008
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: American technical standard
Kategorie: Technické normy ASTM

Annotation of standard text ASTM F1262M-95(2008) :

Keywords:
digital integrated circuits, digital IC´s, functional errors, ionizing, pulsed radiation, radiation, transient radiation, upset threshold, Combinational logic, Destructive testing--semiconductors, Digital integrated circuits, Electrical conductors (semiconductors), Failure end point--electronic components/devices, 0Functional errors, Integrated circuits, Ionizing radiation, Irradiance/irradiation--semiconductors, 0Microelectronic devices, MSI integrated circuits, Output transient voltage