ASTM F1153-92(2002)

Standard Test Method for Characterization of Metal-Oxide-Silicon (MOS) Structures by Capacitance-Voltage Measurements (Withdrawn 2003)

NORMA vydána dne 15.5.1992

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The information about the standard:

Designation standards: ASTM F1153-92(2002)
Note: NEPLATNÁ
Publication date standards: 15.5.1992
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: American technical standard
Kategorie: Technické normy ASTM

Annotation of standard text ASTM F1153-92(2002) :

Keywords:
capacitance-voltage, carrier concentration, fixed charge density, flatband capacitance, flatband voltage, metal-oxide-silicon structures, mobile ionic charge, MOS structures, silicon, ICS Number Code 31.060.01 (Capacitors in general)