
Standard Practice for Shallow Etch Pit Detection on Silicon Wafers (Withdrawn 2003
NORMA vydána dne 10.12.2002
Designation standards: ASTM F1049-02
Note: NEPLATNÁ
Publication date standards: 10.12.2002
The number of pages: 4
Approximate weight : 12 g (0.03 lbs)
Country: American technical standard
Kategorie: Technické normy ASTM
Keywords:
epitaxial, oxidation, preferential etch, saucer pit, shallow etch pit, silicon, ICS Number Code 29.045 (Semiconducting materials)