Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics

Informace o normě:

Označení normy: ASTM E722-09
Poznámka: NEPLATNÁ
Datum vydání normy: 1.6.2009
Počet stran: 27
Přibližná hmotnost: 81 g (0.18 liber)
Země: Americká technická norma
Kategorie: Technické normy ASTM

Anotace textu normy ASTM E722-09 :

Keywords:
displacement damage, electronic hardness, gallium arsenide, hardness parameter, silicon, silicon damage, silicon equivalent damage (SED), 1-MeV equivalent fluence, Displacement--electronic materials/applications, Electrical conductors (semiconductors), Electronic hardness, Gamma radiation--electronic components/devices, 1MeV equivalent fluence, Neutron flux/fluence, Neutron sensors, Radiation-hardness testing, Silicon equivalent damage (SED), Silicon semiconductors