Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices

Informace o normě:

Označení normy: ASTM E668-00
Poznámka: NEPLATNÁ
Datum vydání normy: 10.6.2000
Počet stran: 18
Přibližná hmotnost: 54 g (0.12 liber)
Země: Americká technická norma
Kategorie: Technické normy ASTM

Anotace textu normy ASTM E668-00 :

Keywords:
Absorbed radiation dose, Dosimetry, Electrical conductors-semiconductors, Electronic hardness, Electronic materials/applications, Electron radiation, Energy deposition-ionizing radiation, Gamma radiation-electronic components/devices, Hardness tests-radiation (of semiconductors), Radiation-hardness testing, Silicon semiconductors, Thermoluminescent dosimeter (TLD), Threshold detectors-60 MeV, X-irradiation, absorbed dose in radiation-hardness testing-electronic