Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
NORMA vydána dne 10.12.1996
Designation standards: ASTM E431-96
Note: NEPLATNÁ
Publication date standards: 10.12.1996
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: American technical standard
Kategorie: Technické normy ASTM
Keywords:
electronic devices, nondestructive testing, radiographs, radiography, reference illustrations, semiconductors, x-ray