ASTM E1634-94(1999)

Standard Guide for Performing Sputter Crater Depth Measurements

NORMA vydána dne 10.4.2002

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Online zabezpečené PDF (1597.60 CZK)

The information about the standard:

Designation standards: ASTM E1634-94(1999)
Note: NEPLATNÁ
Publication date standards: 10.4.2002
The number of pages: 3
Approximate weight : 9 g (0.02 lbs)
Country: American technical standard
Kategorie: Technické normy ASTM

Annotation of standard text ASTM E1634-94(1999) :

Keywords:
Auger electron spectroscopy, secondary ion mass spectrometry, stylus profilometry, surface analysis , x-ray photoelectron spectroscopy, ICS Number Code 71.040.50 (Physicochemical methods of analysis)