ASTM E1438-26

Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS

NORMA vydána dne 1.10.2026

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The information about the standard:

Designation standards: ASTM E1438-26
Publication date standards: 1.10.2026
The number of pages: 3
Approximate weight : 9 g (0.02 lbs)
Country: American technical standard
Kategorie: Technické normy ASTM

Annotation of standard text ASTM E1438-26 :

Keywords:
ICS Number Code 29.045 (Semiconducting materials)