Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices

Informace o normě:

Označení normy: ASTM E1250-88(2000)
Poznámka: NEPLATNÁ
Datum vydání normy: 10.6.2000
Počet stran: 10
Přibližná hmotnost: 30 g (0.07 liber)
Země: Americká technická norma
Kategorie: Technické normy ASTM

Anotace textu normy ASTM E1250-88(2000) :

Keywords:
Cobalt-60 irradiators, Electrical conductors-semiconductors, Electronic hardness, Electronic materials/applications, Gamma radiation, Hardness tests-radiation (of semiconductors), Ionizing radiation, Irradiance/irradiation, Low-energy gamma radiation, Photon energy spectrum, Radiation exposure-nuclear materials/applications, Radiation-hardness testing, Silicon-semiconductor applications, ionization chambers to assess the low energy gamma component of