Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
NORMA vydána dne 10.4.2000
Označení normy: ASTM E1217-00
Poznámka: NEPLATNÁ
Datum vydání normy: 10.4.2000
Počet stran: 7
Přibližná hmotnost: 21 g (0.05 liber)
Země: Americká technická norma
Kategorie: Technické normy ASTM
Keywords:
Absorbed current, Computer programs, Current measurement, Deflection, Detectors, Line scan, Oscilloscope, Raster scan, Scanning, Signal detection, Specimen area, Spectrometry, Spectroscopy-auger electron (AES), Spectroscopy-x-ray photoelectron, Surface analysis-spectrochemical analysis, Topography, Voltage, Waveform, specimen area contributing to detected signal in, photoelectron/auger-electron spectroscopy, practice, ICS Number Code 71.040.50 (Physicochemical methods of analysis)