ASTM E1162-11

Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)

NORMA vydána dne 1.11.2011

Anglicky -
Online zabezpečené PDF (1601.80 CZK)

The information about the standard:

Designation standards: ASTM E1162-11
Note: NEPLATNÁ
Publication date standards: 1.11.2011
The number of pages: 3
Approximate weight : 9 g (0.02 lbs)
Country: American technical standard
Kategorie: Technické normy ASTM

Annotation of standard text ASTM E1162-11 :

Keywords:
ICS Number Code 71.040.50 (Physicochemical methods of analysis)