ASTM E1161-95

Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components

NORMA vydána dne 1.1.1995

Anglicky -
Online zabezpečené PDF (1601.80 CZK)

The information about the standard:

Designation standards: ASTM E1161-95
Note: NEPLATNÁ
Publication date standards: 1.1.1995
The number of pages: 3
Approximate weight : 9 g (0.02 lbs)
Country: American technical standard
Kategorie: Technické normy ASTM

Annotation of standard text ASTM E1161-95 :

Keywords:
Defects,emsemiconductors, Electrical conductors,emsemiconductors, Electronic materials/applications, Sealing glass defects, Voids, X-irradiation, radiographic testing of semiconductors and electronic components, test,, Radiographic testing, semiconductors and electronic components, test,,Order Form, ICS Number Code 31.080.01 (Semi-conductor devices in general)