ASTM E1161-03

Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components

NORMA vydána dne 10.6.2003

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The information about the standard:

Designation standards: ASTM E1161-03
Note: NEPLATNÁ
Publication date standards: 10.6.2003
The number of pages: 4
Approximate weight : 12 g (0.03 lbs)
Country: American technical standard
Kategorie: Technické normy ASTM

Annotation of standard text ASTM E1161-03 :

Keywords:
electronic devices, nondestructive testing, radiographic, radioscopy, semiconductors, X-Ray