ASTM E1127-24

Standard Guide for Depth Profiling in Auger Electron Spectroscopy

NORMA vydána dne 1.10.2024

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The information about the standard:

Designation standards: ASTM E1127-24
Publication date standards: 1.10.2024
The number of pages: 6
Approximate weight : 18 g (0.04 lbs)
Country: American technical standard
Kategorie: Technické normy ASTM

Annotation of standard text ASTM E1127-24 :

Keywords:
angle lapping, angle-resolved AES, Auger electron spectroscopy, ball cratering, compositional depth profiling, cross sectioning, depth profiling, depth resolution, sputter depth profiling, sputtering, thin films,