Publikace  ASTM Volume 10.04 - Electronics; Declarable Substances in Materials; 3D Imaging Systems; Additive Manufacturing Technologies 1.4.2019 náhled

ASTM Volume 10.04 - Electronics; Declarable Substances in Materials; 3D Imaging Systems; Additive Manufacturing Technologies

ASTM Volume 10.04 - Electronics; Declarable Substances in Materials; 3D Imaging Systems; Additive Manufacturing Technologies

Přeložit název

PUBLIKACE vydána dne 1.4.2019


Jazyk
Provedení
Dostupnostdo 7 pracovních dnů
Cena6 917.80 bez DPH
6 917.80

Informace o produktu:

Označení: ASTM Volume 10.04 - Electronics; Declarable Substances in Materials; 3D Imaging Systems; Additive Manufacturing Technologies
Počet stran: 1164
Přibližná hmotnost: 3523 g (7.77 liber)
Datum vydání: 1.4.2019
Země: Americká publikace
Kategorie: ASTM Section 10 - Electrical Insulation and Electronics

Anotace textu normy :

Volume 10.04 covers standards on electronics, including:

• Innerlayer interconnections and bonding

• Materials and processes for vacuum tubes

• Electronic device characterization

• Hermetic seals

• Hybrid circuits and substrates

• Microelectronic packaging

• Leak testing

• And more This volume also includes the latest standards relating to:

• Declarable substances in materials

• 3D imaging systems

• Additive manufacturing technologies


Table of Contents



E2544-11a(2019)   Standard Terminology for Three-Dimensional (3D) Imaging Systems
E2641-09(2017)   Standard Practice for Best Practices for Safe Application of 3D Imaging Technology
E2807-11(2019)   Standard Specification for 3D Imaging Data Exchange, Version 1.0
E2919-14   Standard Test Method for Evaluating the Performance of Systems that Measure Static, Six Degrees of Freedom (6DOF), Pose
E2938-15   Standard Test Method for Evaluating the Relative-Range Measurement Performance of 3D Imaging Systems in the Medium Range
E3064-16   Standard Test Method for Evaluating the Performance of Optical Tracking Systems that Measure Six Degrees of Freedom (6DOF) Pose
E3124-17   Standard Test Method for Measuring System Latency Performance of Optical Tracking Systems that Measure Six Degrees of Freedom (6DOF) Pose
E3125-17   Standard Test Method for Evaluating the Point-to-Point Distance Measurement Performance of Spherical Coordinate 3D Imaging Systems in the Medium Range
F7-95(2016)   Standard Specification for Aluminum Oxide Powder
F15-04(2017)   Standard Specification for Iron-Nickel-Cobalt Sealing Alloy
F16-12(2017)   Standard Test Methods for Measuring Diameter or Thickness of Wire and Ribbon for Electronic Devices and Lamps
F18-12(2017)   Standard Specification and Test Method for Evaluation of Glass-to-Metal Headers Used in Electron Devices
F19-11(2016)   Standard Test Method for Tension and Vacuum Testing Metallized Ceramic Seals
F29-97(2017)   Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications
F30-96(2017)   Standard Specification for Iron-Nickel Sealing Alloys
F31-16   Standard Specification for Nickel-Chromium-Iron Sealing Alloys
F44-16   Standard Specification for Metallized Surfaces on Ceramic
F72-17   Standard Specification for Gold Wire for Semiconductor Lead Bonding
F73-96(2017)   Standard Specification for Tungsten-Rhenium Alloy Wire for Electron Devices and Lamps
F76-08(2016)e1   Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
F83-71(2018)   Standard Practice for Definition and Determination of Thermionic Constants of Electron Emitters
F85-76(2018)   Standard Practice for Nomenclature for Wire Leads Used as Conductors in Electron Tubes
F96-77(2015)   Standard Specification for Electronic Grade Alloys of Copper and Nickel in Wrought Forms
F106-12(2017)   Standard Specification for Brazing Filler Metals for Electron Devices
F180-94(2015)   Standard Test Method for Density of Fine Wire and Ribbon Wire for Electronic Devices
F204-76(2018)   Standard Test Method for Surface Flaws in Tungsten Seal Rod and Wire
F205-94(2015)   Standard Test Method for Measuring Diameter of Fine Wire by Weighing
F219-96(2018)   Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps
F256-05(2015)   Standard Specification for Chromium-Iron Sealing Alloys with 18 or 28 Percent Chromium
F269-60(2019)   Standard Test Method for Sag of Tungsten Wire
F288-96(2019)   Standard Specification for Tungsten Wire for Electron Devices and Lamps
F289-96(2019)   Standard Specification for Molybdenum Wire and Rod for Electronic Applications
F290-94(2015)   Standard Specification for Round Wire for Winding Electron Tube Grid Laterals
F364-96(2019)   Standard Specification for Molybdenum Flattened Wire for Electron Tubes?
F375-89(2015)   Standard Specification for Integrated Circuit Lead Frame Material
F390-11   Standard Test Method for Sheet Resistance of Thin Metallic Films With a Collinear Four-Probe Array
F448-18   Standard Test Method for Measuring Steady-State Primary Photocurrent
F458-13(2018)   Standard Practice for Nondestructive Pull Testing of Wire Bonds
F459-13(2018)   Standard Test Methods for Measuring Pull Strength of Microelectronic Wire Bonds
F487-13(2018)   Standard Specification for Fine Aluminum–1?% Silicon Wire for Semiconductor Lead-Bonding
F615M-95(2013)   Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric)
F744M-16   Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
F773M-16   Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric)
F980-16   Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
F996-11(2018)   Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current–Voltage Characteristics
F1094-87(2012)   Standard Test Methods for Microbiological Monitoring of Water Used for Processing Electron and Microelectronic Devices by Direct Pressure Tap Sampling Valve and by the Presterilized Plastic Bag Method
F1190-18   Standard Guide for Neutron Irradiation of Unbiased Electronic Components
F1192-11(2018)   Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
F1238-95(2011)   Standard Specification for Refractory Silicide Sputtering Targets for Microelectronic Applications
F1262M-14   Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
F1263-11   Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
F1269-13(2018)   Standard Test Methods for Destructive Shear Testing of Ball Bonds
F1367-98(2011)   Standard Specification for Chromium Sputtering Targets for Thin Film Applications
F1372-93(2012)   Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
F1373-93(2012)   Standard Test Method for Determination of Cycle Life of Automatic Valves for Gas Distribution System Components
F1374-92(2012)   Standard Test Method for Ionic/Organic Extractables of Internal Surfaces-IC/GC/FTIR for Gas Distribution System Components
F1375-92(2012)   Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
F1376-92(2012)   Standard Guide for Metallurgical Analysis for Gas Distribution System Components
F1394-92(2012)   Standard Test Method for Determination of Particle Contribution from Gas Distribution System Valves
F1396-93(2012)   Standard Test Method for Determination of Oxygen Contribution by Gas Distribution System Components
F1397-93(2012)   Standard Test Method for Determination of Moisture Contribution by Gas Distribution System Components
F1398-93(2012)   Standard Test Method for Determination of Total Hydrocarbon Contribution by Gas Distribution System Components
F1438-93(2012)   Standard Test Method for Determination of Surface Roughness by Scanning Tunneling Microscopy for Gas Distribution System Components
F1466-99(2015)   Standard Specification for Iron-Nickel-Cobalt Alloys for Metal-to-Ceramic Sealing Applications
F1467-18   Standard Guide for Use of an X-Ray Tester (?10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
F1512-94(2011)   Standard Practice for Ultrasonic C-Scan Bond Evaluation of Sputtering Target-Backing Plate Assemblies
F1513-99(2011)   Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications
F1578-07(2014)   Standard Test Method for Contact Closure Cycling of a Membrane Switch
F1593-08(2016)   Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum by High Mass-Resolution Glow-Discharge Mass Spectrometer
F1594-95(2011)   Standard Specification for Pure Aluminum (Unalloyed) Source Material for Vacuum Coating Applications
F1595-00(2012)   Standard Practice for Viewing Conditions for Visual Inspection of Membrane Switches
F1596-15   Standard Test Method for Exposure of a Membrane Switch or Printed Electronic Device to Temperature and Relative Humidity
F1598-95(2014)   Standard Test Method for Determining the Effects of Chemical/Solvent Exposure to a Membrane Switch/Graphic Overlay (Spot Test Method)
F1661-09(2015)   Standard Test Method for Determining the Contact Bounce Time of a Membrane Switch
F1662-16   Standard Test Method for Verifying the Specified Dielectric Withstand Voltage and Determining the Dielectric Breakdown Voltage of a Membrane Switch or Printed Electronic Device
F1663-15   Standard Test Method for Determining the Capacitance of a Membrane Switch or Printed Electronic Device
F1680-07a(2014)   Standard Test Method for Determining Circuit Resistance of a Membrane Switch
F1681-14   Standard Test Method for Determining Current Carrying Capacity of a Membrane Switch Circuit
F1684-06(2016)   Standard Specification for Iron-Nickel and Iron-Nickel-Cobalt Alloys for Low Thermal Expansion Applications
F1689-05(2012)   Standard Test Method for Determining the Insulation Resistance of a Membrane Switch
F1709-97(2016)   Standard Specification for High Purity Titanium Sputtering Targets for Electronic Thin Film Applications
F1710-08(2016)   Standard Test Method for Trace Metallic Impurities in Electronic Grade Titanium by High Mass-Resolution Glow Discharge Mass Spectrometer
F1711-96(2016)   Standard Practice for Measuring Sheet Resistance of Thin Film Conductors for Flat Panel Display Manufacturing Using a Four-Point Probe Method
F1761-00(2011)   Standard Test Method for Pass Through Flux of Circular Magnetic Sputtering Targets
F1762-14   Standard Test Method for Determining the Effects of Atmospheric Pressure Variation on a Membrane Switch
F1812-15   Standard Test Method for Determining the Effect of an ESD Discharge on a Membrane Switch or Printed Electronic Device
F1842-15   Standard Test Method for Determining Ink or Coating Adhesion on Flexible Substrates for a Membrane Switch or Printed Electronic Device
F1843-15   Standard Practice for Sample Preparation of Plastic Films used on Membrane Switch Overlays for Specular Gloss Measurements
F1844-97(2016)   Standard Practice for Measuring Sheet Resistance of Thin Film Conductors For Flat Panel Display Manufacturing Using a Noncontact Eddy Current Gage
F1845-08(2016)   Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Resolution Glow Discharge Mass Spectrometer
F1892-12(2018)   Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
F1893-18   Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
F1894-98(2011)   Test Method for Quantifying Tungsten Silicide Semiconductor Process Films for Composition and Thickness
F1895-14   Standard Test Method for Submersion of a Membrane Switch
F1896-16   Test Method for Determining the Electrical Resistivity of a Printed Conductive Material
F1995-13   Standard Test Method for Determining the Shear Strength of the Bond between a Surface Mount Device (SMD) and Substrate in a Membrane Switch
F1996-14   Standard Test Method for Silver Migration for Membrane Switch Circuitry
F2072-14   Standard Test Method for Hosedown of a Membrane Switch
F2073-14   Standard Test Method for Non-Destructive Short Circuit Testing of a Membrane Switch
F2112-02(2011)   Standard Terminology for Membrane Switches
F2113-01(2011)   Standard Guide for Analysis and Reporting the Impurity Content and Grade of High Purity Metallic Sputtering Targets for Electronic Thin Film Applications
F2187-02(2011)   Standard Test Method for Determining the Effect of Random Frequency Vibration on a Membrane Switch or Membrane Switch Assembly
F2188-02(2011)   Standard Test Method for Determining the Effect of Variable Frequency Vibration on a Membrane Switch or Membrane Switch Assembly
F2359-04(2011)   Standard Test Method for Determining Color of a Membrane Switch Backlit with Diffuse Light Source
F2360-08(2015)e1   Standard Test Method for Determining Luminance of a Membrane Switch Backlit with Diffuse Light Source
F2405-04(2011)   Standard Test Method for Trace Metallic Impurities in High Purity Copper by High-Mass-Resolution Glow Discharge Mass Spectrometer
F2576-15a   Standard Terminology Relating to Declarable Substances in Materials
F2577-14   Standard Guide for Assessment of Materials and Products for Declarable Substances
F2592-16   Standard Test Method for Measuring the Force-Displacement of a Membrane Switch
F2617-15   Standard Test Method for Identification and Quantification of Chromium, Bromine, Cadmium, Mercury, and Lead in Polymeric Material Using Energy Dispersive X-ray Spectrometry
F2725-11   Standard Guide for European Unions Registration, Evaluation, and Authorization of Chemicals (REACH) Supply Chain Information Exchange
F2749-15   Standard Test Method for Determining the Effects of Creasing a Membrane Switch or Printed Electronic Device
F2750-16   Standard Test Method for Determining the Effects of Bending a Membrane Switch or Printed Electronic Device
F2771-10(2016)   Standard Test Method for Determining the Luminance Curve of an Electroluminescent Lamp at Ambient Conditions
F2853-10(2015)   Standard Test Method for Determination of Lead in Paint Layers and Similar Coatings or in Substrates and Homogenous Materials by Energy Dispersive X-Ray Fluorescence Spectrometry Using Multiple Monochromatic Excitation Beams
F2865-13   Standard Guide for Classifying the Degrees of Ingress of Dust and Water into a Membrane Switch
F2866-11   Standard Test Method for Flammability of a Membrane Switch in Defined Assembly
F2924-14   Standard Specification for Additive Manufacturing Titanium-6 Aluminum-4 Vanadium with Powder Bed Fusion
F2931-19   Standard Guide for Analytical Testing of Substances of Very High Concern in Materials and Products
F2964-12   Standard Test Method for Determining the Uniformity of the Luminance of an Electroluminescent Lamp or Other Diffuse Lighting Device
F2971-13   Standard Practice for Reporting Data for Test Specimens Prepared by Additive Manufacturing
F2980-13(2017)   Standard Test Method for Analysis of Heavy Metals in Glass by Field Portable X-Ray Fluorescence (XRF)
F3001-14   Standard Specification for Additive Manufacturing Titanium-6 Aluminum-4 Vanadium ELI (Extra Low Interstitial) with Powder Bed Fusion
F3049-14   Standard Guide for Characterizing Properties of Metal Powders Used for Additive Manufacturing Processes
F3055-14a   Standard Specification for Additive Manufacturing Nickel Alloy (UNS N07718) with Powder Bed Fusion
F3056-14e1   Standard Specification for Additive Manufacturing Nickel Alloy (UNS N06625) with Powder Bed Fusion
F3078-15   Standard Test Method for Identification and Quantification of Lead in Paint and Similar Coating Materials using Energy Dispersive X-ray Fluorescence Spectrometry (EDXRF)
F3091/F3091M-14   Standard Specification for Powder Bed Fusion of Plastic Materials
F3122-14   Standard Guide for Evaluating Mechanical Properties of Metal Materials Made via Additive Manufacturing Processes
F3139-15   Standard Test Method for Analysis of Tin-Based Solder Alloys for Minor and Trace Elements Using Inductively Coupled Plasma Atomic Emission Spectrometry
F3147-15   Standard Test Method for Evaluating the Reliability of Surface Mounted Device (SMD) Joints on a Flexible Circuit by a Rolling Mandrel Bend
F3152-16   Standard Test Method for Determining Abrasion Resistance of Inks and Coatings on Substrates Using Dry or Wet Abrasive Medium
F3166-16   Standard Specification for High-Purity Titanium Sputtering Target Used for Through-Silicon Vias (TSV) Metallization
F3184-16   Standard Specification for Additive Manufacturing Stainless Steel Alloy (UNS S31603) with Powder Bed Fusion
F3187-16   Standard Guide for Directed Energy Deposition of Metals
F3192-16   Standard Specification for High-Purity Copper Sputtering Target Used for Through-Silicon Vias (TSV) Mettalization
F3213-17   Standard for Additive Manufacturing – Finished Part Properties – Standard Specification for Cobalt-28 Chromium-6 Molybdenum via Powder Bed Fusion
F3290-17   Standard Guide for Handling and Application of a Membrane Switch or Printed Electronic Device to its Final Support Structure
F3291-17   Standard Test Method for Measuring the Force-Resistance of a Membrane Force Sensor
F3301-18a   Standard for Additive Manufacturing – Post Processing Methods – Standard Specification for Thermal Post-Processing Metal Parts Made Via Powder Bed Fusion
F3302-18   Standard for Additive Manufacturing – Finished Part Properties – Standard Specification for Titanium Alloys via Powder Bed Fusion
F3303-18   Standard for Additive Manufacturing – Process Characteristics and Performance: Practice for Metal Powder Bed Fusion Process to Meet Critical Applications
F3318-18   Standard for Additive Manufacturing – Finished Part Properties – Specification for AlSi10Mg with Powder Bed Fusion – Laser Beam
ISO/ASTM52900-15 Standard Terminology for Additive Manufacturing – General Principles – Terminology
ISO/ASTM52915-16 Standard Specification for Additive Manufacturing File Format (AMF) Version 1.2
ISO/ASTM52901-16 Standard Guide for Additive Manufacturing – General Principles – Requirements for Purchased AM Parts
ISO/ASTM52910-18 Additive manufacturing — Design — Requirements, guidelines and recommendations
ISO/ASTM52921-13 Standard Terminology for Additive Manufacturing-Coordinate Systems and Test Methodologies

Odebírejte informace o nově vydaných normách ZDARMA:

Chcete pravidelně odebírat informace o nově vycházejících normách z celého světa a to zcela zdarma?
Přihlašte se k odběru. Vše je velice jednoduché a absolutně ZDARMA.
Na výběr máte vydavatele z celého světa.


Tento web používá soubory cookie. Dalším procházením tohoto webu vyjadřujete souhlas s jejich používáním. Více informací / Rozumím