Standard Guide for Use of an X-Ray Tester (approximately equal10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
NORMA vydána dne 1.10.2011
Označení normy: ASTM F1467-11
Poznámka: NEPLATNÁ
Datum vydání normy: 1.10.2011
Počet stran: 18
Přibližná hmotnost: 54 g (0.12 liber)
Země: Americká technická norma
Kategorie: Technické normy ASTM
Keywords:
ionizing radiation effects, microcircuits, radiation hardness, semiconductor devices, X-ray testing: Collimator/collimation, Electrical conductors (semiconductors), Electronic hardness, Experimental design/evaluation, Ionizing radiation, Low-energy radiation, Microcircuits, Microelectronic devices, Radiation exposure--electronic components/devices, Radiation-hardness testing, Semiconductor device testing, X-ray testing, ICS Number Code 31.020 (Electronic components in general)