Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

Informace o normě:

Označení normy: ASTM F1192-11
Poznámka: NEPLATNÁ
Datum vydání normy: 1.10.2011
Počet stran: 11
Přibližná hmotnost: 33 g (0.07 liber)
Země: Americká technická norma
Kategorie: Technické normy ASTM

Anotace textu normy ASTM F1192-11 :

Keywords:
SEB, SEE, SEFI, SEGR, SEL, SEP, SEP cross section, SEU, single event, single event effect, single event phenomena, single event upset, space environment: Destructive testing--semiconductors, Dosimetry, Electrical conductors (semiconductors), Electron radiation, Failure end point--electronic components/devices, Fluence, Galactic cosmic rays, Germanium--semiconductor applications, Integrated circuits, Ionizing radiation, Irradiance/irradiation--semiconductors, Linear energy transfer (LET)