ASTM E1438-11(2019)

Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS

NORMA vydána dne 1.11.2019

Anglicky -
PDF - okamžité stažení (1280.60 CZK)

The information about the standard:

Designation standards: ASTM E1438-11(2019)
Publication date standards: 1.11.2019
The number of pages: 3
Approximate weight : 9 g (0.02 lbs)
Country: American technical standard
Kategorie: Technické normy ASTM

Annotation of standard text ASTM E1438-11(2019) :

Keywords:
ICS Number Code 29.045 (Semiconducting materials)