Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
NORMA vydána dne 1.12.2010
Označení normy: ASTM E1250-10
Poznámka: NEPLATNÁ
Datum vydání normy: 1.12.2010
Počet stran: 10
Přibližná hmotnost: 30 g (0.07 liber)
Země: Americká technická norma
Kategorie: Technické normy ASTM
Keywords:
absorbed dose, Co-60 irradiators, dose enhancement, ionization chamber, radiation hardness testing, Absorbed radiation dose, Cobalt-60 radiography, Dose enhancement, Electrical conductors (semiconductors), Electronic hardness, Electronic materials/applications, Gamma radiation--electronic components/devices, Ionizing radiation, Irradiance/irradiation--nuclear applications, Low-energy radiation, Photon energy spectrum, Radiation exposure--nuclear materials/applications